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繁中
Equipment
Silicon Photonics
High Frequency, High Speed PIC/ EIC Measurement System
Silicon Photonics Optical Measurement System
Cryogenic On-chip
4K Cryogenic Probe Station
Advanced Analog Meas.
Analog Measurement System
High-frequency Circuits
Customized High-Frequency Circuit Measurement System
40GHz Measurement System
67GHz Measurement System
Signal Source Param. Measurement System
Technical consultation of Load-Pull Nonlinear Measurement System
High-frequency Devices
67GHz S-param. Measurement System
High Frequency Noise Param. Measurement System
High Frequency Power Param. Measurement System
110 GHz S-Parameter Measurement System
Nonlinear Vector Network Analysis System
Millimeter-wave Noise/Power Param. Measurement System
220 GHz S-Parameter Measurement System
110GHz Harmonic Load Pull Measurement System
Nano and Power Devices
Nano Device Param. Measurement System
Low Frequency Noise Measurement System
IV&CV Electrical Measurement System
Power Device Measurement System
Antennas
Antenna Measurement System
MEMS
MEMS System
SoC Test
ADVANTEST V93000 ATE
General Equipment
Die Photo(Hsinchu)
Wire Bonder SUB668(User Self-service)
Laser Cutter
Oscilloscope(LeCroy LT584)
Programmable Compact Temperature & Humidity System
Al Wire Bonding(User Self-service)
PCB Prototype Machine
Die Photo(Tainan)
Protocol
Information
Reservation
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Oscilloscope(LeCroy LT584)
Equipment Introduction
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